The ELEDIA Research Center is pleased to announce that a new paper has been published in the IEEE Open Journal of Instrumentation and Measurement:
M. Salucci, L. Poli, G. Gottardi, G. Oliveri, L. Tosi and A. Massa, “Microwave NDT/NDE Through Differential Bayesian Compressive Sensing,” in IEEE Open Journal of Instrumentation and Measurement, vol. 3, pp. 1-15, 2024, Art no. 4500215, doi: 10.1109/OJIM.2024.3412205.
The paper can be downloaded at the following link: https://lnkd.in/d3EAppq4
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