?url_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Adc&rft.relation=http%3A%2F%2Fwww.eledia.org%2Fstudents-reports%2F539%2F&rft.title=Edge+Potential+Functions+(EPF)+and+Genetic+Algorithms+(GA)+for+Edge-Based+Matching+of+Visual+Objects&rft.creator=Dao%2C+S.M.&rft.creator=De+Natale%2C+Francesco&rft.creator=Massa%2C+Andrea&rft.subject=TU+Technical+Reports+and+Publications&rft.description=Edges+are+known+to+be+a+semantically+rich+representation+of+the+contents+of+a+digital+image.+Nevertheless%2C+their+use+in+practical+applications+is+sometimes+limited+by+computation+and+complexity+constraints.+In+this+paper%2C+a+new+approach+is+presented+that+addresses+the+problem+of+matching+visual+objects+in+digital+images+by+combining+the+concept+of+Edge+Potential+Functions+(EPF)+with+a+powerful+matching+tool+based+on+Genetic+Algorithms+(GA).+EPFs+can+be+easily+calculated+starting+from+an+edge+map+and+provide+a+kind+of+attractive+pattern+for+a+matching+contour%2C+which+is+conveniently+exploited+by+GAs.+Several+tests+were+performed+in+the+framework+of+different+image+matching+applications.+The+results+achieved+clearly+outline+the+potential+of+the+proposed+method+as+compared+to+state+of+the+art+methodologies.+(c)+2007+IEEE.+Personal+use+of+this+material+is+permitted.+Permission+from+IEEE+must+be+obtained+for+all+other+users%2C+including+reprinting%2F+republishing+this+material+for+advertising+or+promotional+purposes%2C+creating+new+collective+works+for+resale+or+redistribution+to+servers+or+lists%2C+or+reuse+of+any+copyrighted+components+of+this+work+in+other+works.&rft.date=2007-01&rft.type=Technical+Report&rft.type=PeerReviewed&rft.format=text&rft.language=en&rft.identifier=http%3A%2F%2Fwww.eledia.org%2Fstudents-reports%2F539%2F1%2FDISI-11-077.R108.pdf&rft.identifier=++Dao%2C+S.M.+and+De+Natale%2C+Francesco+and+Massa%2C+Andrea++(2007)+Edge+Potential+Functions+(EPF)+and+Genetic+Algorithms+(GA)+for+Edge-Based+Matching+of+Visual+Objects.++%5BTechnical+Report%5D+++++