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Improved Microwave Imaging Procedure for Non-Destructive Evaluations of Two-Dimensional Structures
An improved microwave procedure for detecting defects in dielectric structures is proposed. The procedure is based on the integral equations of the inverse scattering problem. A hybrid Genetic Algorithm is applied in order to minimize the obtained nonlinear functional. Since in nondestructive evaluations the unperturbed object is completely known, it is possible off-line to numerically compute the Green's function for the configuration without defects. Consequently, a very dignificant computation saving is obtained, since the 'chromosome' of the Genetic Algorithm codes only the parameters describing the unknown defect.
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