ELEDIA Turns 20!

ELEDIA Turns 20! It was back in October-November 2000 that the ELEDIA brand began to circulate in an official form…

Special Issue in Advanced Technology Related to Radar Signal

The ELEDIA Research Center is pleased to announce that Prof. Toshifumi Moriyama will be the Guest Editor of a Special Issue on "Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Section Measurement".

The aim of this Special Issue of Electronics is to present state-of-the-art investigations in various radar-important technologies for future applications. We invite researchers to contribute original and unique articles, as well as sophisticated review articles. Topics include, but not limited to, the following areas: radar imaging technology inverse synthetic aperture radar imaging inverse electromagnetic scattering short-distance radar collision-avoidance radar subsurface and ground penetrating radar microwave remote sensing image analysis RCS near-field to far-field transformation radar electromagnetic modeling and simulation target recognition radar data fusion

Deadline for manuscript submissions: 30 April 2019.

The call for papers could be found here.

More information can be found here.